| EPSRC Reference: |
EP/C511085/1 |
| Title: |
Accurate and Repeatable Measurement Of The Thermal Profile Of RF Solid State Devices Under Active Operation |
| Principal Investigator: |
Oxley, Dr CH |
| Other Investigators: |
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| Researcher Co-Investigators: |
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| Project Partners: |
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| Department: |
School of Engineering & Technology |
| Organisation: |
De Montfort University |
| Scheme: |
Standard Research (Pre-FEC) |
| Starts: |
01 July 2005 |
Ends: |
30 June 2008 |
Value (£): |
235,246
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| EPSRC Research Topic Classifications: |
| Electronic Devices & Subsys. |
RF & Microwave Technology |
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Summary on Grant Application Form |
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There is a requirement within the UK for a dedicated facility to accurately measure the thermal profile of active and passive electronic devices in order to ascertian the device thermal performance, reliability and assist in the design of improved device thermal management technologies. This is becoming increasingly important with minaturisation (3-D mmic etc), high power densities (GaN HEMT, SiC MESFET etc) and a recent directive by EU excluding BeO in packaging technologies. Similar measurement facilities exist in USA, Scandanavia and Japan. It is proposed to set-up a facility at De Montfort University with an up to date infra red (IR) microscope giving a resolution of approximately 2.8 microns, supplied by Quantum Focus Instruments Corporation. The overall accuracy of the device temperature profile measurement will depend on the research and development of improved emissivity correction technology which will take into account, for example, all sources of background radiation. Dr P.Webb initiated this work at Birmingham University and has since retired but will act as an expert consultant, the more complex mathematical interpolation methods will be handled by Prof G.Evans known for his work in numerical quardrature analysis. De Monfort University is geographically well positioned within the UK to provide a central measurement house and the principal investigator has a number of years of experience of interpretation of IR signatures of semiconductor devices. Quantum Focus Instruments Corporation in conjunction with Firfax Systems Ltd will partially fund the IR microscope (Donations/University discount $64,000) and E2V Technologies will give a direct cash contribution of 5000.00.
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Key Findings |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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Potential use in non-academic contexts |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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Impacts |
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| Description |
This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk |
| Summary |
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| Date Materialised |
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Sectors submitted by the Researcher |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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| Project URL: |
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| Further Information: |
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| Organisation Website: |
http://www.dmu.ac.uk |