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Details of Grant 

EPSRC Reference: GR/L53724/01
Title: SIGE FOR MOS TECHNOLOGIES
Principal Investigator: Zhang, Professor J
Other Investigators:
Joyce, Professor BA
Researcher Co-Investigators:
Project Partners:
GEC Pre Nexus Migration QinetiQ
Siemens
Department: Physics
Organisation: Imperial College London
Scheme: Standard Research (Pre-FEC)
Starts: 01 November 1997 Ends: 31 October 2000 Value (£): 282,918
EPSRC Research Topic Classifications:
Electronic Devices & Subsys.
EPSRC Industrial Sector Classifications:
Electronics
Related Grants:
Panel History:  
Summary on Grant Application Form
A co-ordinated research activity involving principally five Universities (Glasgow, Imperial College (London), Newcastle, Southampton and Warwick) and industry (GPS, DRA, Siemens and TMA) concerned with the evaluation and maximisation of the performance enhancements accessible through incorporating SiGe layers in Si MOSFET devices. An assessment of the possibility of using a pseudomorphic SiGe/Si structure to improve p-channel device performance to match that of the n-channel device in CMOS is an important early objective. The principal focus is on n- and p-channel devices produced on relaxed SiGe buffer layers (virtual substrates (VS)) which have already been shown to be capable of yielding very significant improvements in deep submicron CMOS performance, The challenge here will be to produce a commercially viable defect free VS technology and three growth centres will have a substantial activity in this area. Process development will be an important theme of the programme with e-beam lithography enabling deep submicron feature sizes to be accessed. There will be a strongly interactive modelling activity to optimise the vertical and lateral architecture of the device. Important deliverables will be demonstrators showing the performance advantages of using SiGe devices in digital CMOS, basic micro-power circuits and in RF applications.
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Organisation Website: http://www.imperial.ac.uk