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Details of Grant 

EPSRC Reference: GR/L54837/01
Title: CHARACTERIZATION OF ADVANCED MATERIALS BY ELECTRON HOLOGRAPHY
Principal Investigator: Midgley, Professor PA
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Chalmers University of Technology Pre Nexus Migration University of Warwick
Department: Materials Science & Metallurgy
Organisation: University of Cambridge
Scheme: Standard Research (Pre-FEC)
Starts: 01 September 1998 Ends: 31 October 2002 Value (£): 161,794
EPSRC Research Topic Classifications:
Materials Characterisation
EPSRC Industrial Sector Classifications:
Electronics Creative Industries
Related Grants:
Panel History:  
Summary on Grant Application Form
Electron holography will be developed on the new FEGSTEM to be installed in Cambridge to measure composition profiles and local electric and magnetic fields in a number of materials of technological interest. In particular, the research will focus on (i) the Si/Ge system, a material with huge potential for optoelectronics and transistor applications, (ii) magnetic thin films and nanowires grown by electrodeposition and (iii) polycrystalline ZnO used in varistor devices. The research will complement existing microanalytical techniques such as large angle convergent beam electron diffraction (LACBED) and energy-filtered imaging. A magnetising stage will allow hysteresis studies to be performed on soft magnetic material used for sensors and switches and an `I-V' stage will allow forward and reverse bias to be applied to semiconductor samples to investigate the potential distribution around p-n junctions. In addition, alternative forms of holography will be explored such as `in-line holography', which with the application of novel phase retrieval algorithms, may lead to a more accurate reconstruction of the local electromagnetic potential than conventional holography.
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Organisation Website: http://www.cam.ac.uk