EPSRC Reference: |
GR/M17839/01 |
Title: |
EARLY STAGE HOT CARRIER DEGRADATION IN STATE-OF-THE- ART DEEP SUBMICRON SEMICONDUCTOR DEVICES |
Principal Investigator: |
de Souza, Professor MM |
Other Investigators: |
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Researcher Co-Investigators: |
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Project Partners: |
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Department: |
School of Engineering & Technology |
Organisation: |
De Montfort University |
Scheme: |
Standard Research (Pre-FEC) |
Starts: |
01 June 1999 |
Ends: |
31 January 2002 |
Value (£): |
123,351
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EPSRC Research Topic Classifications: |
Electronic Devices & Subsys. |
VLSI Design |
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EPSRC Industrial Sector Classifications: |
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Related Grants: |
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Panel History: |
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Summary on Grant Application Form |
The aim of this research proposal is to investigate early mode hot carrier degradation in state-of-the-art deep submicron VLSI devices using stress times beginning with 0.1 milliseconds. The proposed work will be crucial to the industrial manufacture of 0.1 micron devices by year 2006, as predicted in the Semiconductor Industry Association (SIA) technology roadmap. In sub-micron devices, hot carriers generated as a result of increased electric fields are trapped in the gate oxide and cause shifts in the electrical parameters of MOS transistors over a period of time. Floating gate measurements will be performed to qualify the nature of this injected charge during the early period. The results will be correlated to the dc characterisation to build a qualitative model which will be validated by computer simulations. An important aspect of this work is to provide a crucial insight into the mechanism by which hot carrier degradation is initiated within a device. Furthermore, the evaluation of the early mode degradation method to extract device lifetimes will result in a significant reduction in the turn-around time and cost of manufacture of VLSI circuits.
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Key Findings |
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Potential use in non-academic contexts |
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Impacts |
Description |
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Summary |
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Date Materialised |
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Sectors submitted by the Researcher |
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Project URL: |
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Further Information: |
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Organisation Website: |
http://www.dmu.ac.uk |