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Details of Grant 

EPSRC Reference: GR/M18027/01
Title: SIZE AND COMPOSITION OF SEMICONDUCTOR NANOSTRUCTURES USING SCANNING TRANSMISSION ELECTRON MICROSCOPY
Principal Investigator: Goodhew, Professor PJ
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Department: Materials Science & Eng
Organisation: University of Liverpool
Scheme: Standard Research (Pre-FEC)
Starts: 01 September 1998 Ends: 31 August 2000 Value (£): 86,865
EPSRC Research Topic Classifications:
Materials Characterisation
EPSRC Industrial Sector Classifications:
No relevance to Underpinning Sectors
Related Grants:
Panel History:  
Summary on Grant Application Form
We propose to investigate the size, composition and shape of InAs/GaAs self-assembled quantum dots (QDs) using STEM. Energy dispersive X-ray analysis will be used as a chemical probe to determine the size of these small structures. Since the electron probe is very small (<1nm) the size (and consequently the shape) of the dots can be determined with reasonable accuracy. Special samples incorporating InGaAs quantum wells will be used to provide an integral calibration for an estimate of the composition of the dots, taking full account of the dot geometry. Provided that the wells are grown close to the dots this will avoid problems associated with variations in foil thickness. Having established a method for the InAs/GaAs material system this will be extended to other semiconductor QD combinations such as InAs/InP and InP/InGaP.
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Organisation Website: http://www.liv.ac.uk