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Details of Grant 

EPSRC Reference: GR/M33266/01
Title: ROPA: TRANSIENT RESPONSE TESTING OF NON-LINEAR ANALOGUE COMPONENTS
Principal Investigator: Taylor, Professor D
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Department: Sch of Computing and Engineering
Organisation: University of Huddersfield
Scheme: ROPA
Starts: 01 October 1998 Ends: 31 March 2000 Value (£): 42,331
EPSRC Research Topic Classifications:
VLSI Design
EPSRC Industrial Sector Classifications:
No relevance to Underpinning Sectors
Related Grants:
Panel History:  
Summary on Grant Application Form
Production testing of analogue components in today's complex mixed-signal systems is a very time consuming and expensive business. During the past decade Transient Response Testing has been developed into a powerful and cost effective functional test technique for linear analogue components and now features on some production testers. The major disadvantage of this technique is that it cannot be employed in the testing of non-linear analogue components as it would not constitute a functional test.The aim of this research is to consider Transient Response Testing as a structural test technique and to examine what fault coverage it can afford for non-linear analogue components in its basic form, and to experiment with suitable ways of enhancing the technique and improving the fault coverage achieved.
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Organisation Website: http://www.hud.ac.uk