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Details of Grant 

EPSRC Reference: GR/M36670/01
Title: HIGH RESOLUTION TOF-SIMS FOR MATERIALS RESEARCH
Principal Investigator: Watts, Professor J
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Department: Engineering and Physical Sciences
Organisation: University of Surrey
Scheme: Standard Research (Pre-FEC)
Starts: 01 October 1998 Ends: 30 September 1999 Value (£): 53,307
EPSRC Research Topic Classifications:
Surfaces & Interfaces
EPSRC Industrial Sector Classifications:
No relevance to Underpinning Sectors
Related Grants:
Panel History:  
Summary on Grant Application Form
A current generation time-of-flight secondary ion mass spectrometer (ToF-SIMS) will be used by a consortium of materials scientists to investigate specific materials/surface characterisation problems which have proved difficult or impossible to solve using techniques (including earlier generation SIMS instruments). The instrument, at ICI Wilton, is unique in the UK through a combination of its capabilities and accessibility. In particular, it can be used both for rapid high mass resolution spectrometry and high spatial resolution imaging. About eight projects, each requiring 2-3 days of data acquisition time plus associated data processing will be carried out. The materials to be investigated cover a diverse range from surface modification for biocompatibilisation and cell-recognition to electronic ceramics. The results will provide a basis for the justification of future access to similar instrumentation for those directly involved and to an overall assessment of the current technology for surface/materials characterisation for the community in general.
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Organisation Website: http://www.surrey.ac.uk