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EPSRC Reference: GR/R75083/01
Title: Advanced reference-beam transmission electron microscopy
Principal Investigator: Cullis, Professor AG
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Department: Electronic and Electrical Engineering
Organisation: University of Sheffield
Scheme: Standard Research (Pre-FEC)
Starts: 07 October 2002 Ends: 06 October 2005 Value (£): 33,695
EPSRC Research Topic Classifications:
Materials Characterisation
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Summary on Grant Application Form
We aim to exploit an electron wave interference phenomenon, which is similar to side-band holography, but which occurs in the diffraction plane of a scanning transmission electron microscope (STEM) to provide 'super-resolution' performance. For reasons to do with the intrinsic stability of this typeof interference, and the symmetry of the scattering geometry, it is proposed that this method promises to lead to much higher-resolution imaging of atomic structure in three dimensions. During the 1990s, pioneering work by the Principal Co-Investigator (Prof John Rodenburg) demonstrated thefeasibility of the method, but at relatively low resolution. Since then, .m.jc(oscope technology has advanced, particularly in respect of thermally-assistedEEGs, CCD detector technology, the stability of the'focussed electron and the base-line resolution. The UK has made a substantial investment inseveral field emission gun TEMs of this type, including the JEOL JEM201OF at Sheffield University which we will use for this project. We believe it istimely to investigate the coherent imaging capabilities of this new Lass of machine, with the view to making the most of the coherent interference electron signal that can be obtained from them. A successful outcome for this project will allow the resolution of all such machines to be improved bythe implementation of appropriate control software. The method will also substantially enhance the proposed new generation of multi-pole aberrationcorrected 'superSTEMs'.
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Organisation Website: http://www.shef.ac.uk