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Details of Grant 

EPSRC Reference: GR/R76035/01
Title: High-resolution impedance imaging for materials charaterisation and life sciences applications
Principal Investigator: Krause, Professor S
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Department: Chemistry
Organisation: University of Sheffield
Scheme: Advanced Fellowship (Pre-FEC)
Starts: 01 October 2002 Ends: 29 February 2004 Value (£): 243,290
EPSRC Research Topic Classifications:
Biomaterials Materials Characterisation
Surfaces & Interfaces
EPSRC Industrial Sector Classifications:
Related Grants:
Panel History:
Panel DatePanel NameOutcome
20 Nov 2001 Technology Fellowships Sift Panel Deferred
Summary on Grant Application Form
A new imaging technique - Scanning Photo-induced Impedance Microscopy (SPIM) has been developed. It is capable of measuring the local impedance of thin films with good lateral resolution. Investigations of model systems have shown very promising results. In this programme, the resolution and the sensitivity of the new technique will be pushed to their limits in order to develop it into an attractive tool for the characterisation of the local properties of materials and biological systems. The applicant and her collaborators have identified potential applications of the imaging technique covering a wide range of different subject areas such as medicine, materials characterisation, membrane proteins and biosensors. SPIM will be used to investigate the process of melanoma invasion in reconstructed human skin models. The microstructure of tissue engineering scaffolds and the adhesion and spreading of cells on these materials will be studied. Other areas of application to be explored in this programme include the investigation of ion channel gating in pore proteins, which has implications for the development of new tools for drug screening, and the development of biosensor arrays capable of detecting proteases released at sites of inflammation and infection.
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Summary
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Organisation Website: http://www.shef.ac.uk