EPSRC Reference: |
GR/S93646/01 |
Title: |
Ultra High Resolution Composition determnation form HREM and STEM images |
Principal Investigator: |
Goodhew, Professor PJ |
Other Investigators: |
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Researcher Co-Investigators: |
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Project Partners: |
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Department: |
School of Engineering |
Organisation: |
University of Liverpool |
Scheme: |
Standard Research (Pre-FEC) |
Starts: |
01 March 2004 |
Ends: |
28 February 2005 |
Value (£): |
49,718
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EPSRC Research Topic Classifications: |
Materials Characterisation |
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EPSRC Industrial Sector Classifications: |
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Related Grants: |
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Panel History: |
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Summary on Grant Application Form |
We propose to further develop methods for atomic-scale compositional analysis based on the extraction of information from high resolution EM images, rather than the conventional approaches using EDX or EELS. These methods have been established recently for strained semiconductor systems using high resolution TEM (HRTEM). We plan to extend these methods to STEM imaging, to dark field (HAADF) images and to ultra-high resolution using SuperSTEM.We wish to take advantage of the opportunity to attract Dr Sanchez, a leading exponent of these techniques, to Liverpool for a year as a Visiting Fellow in order that the methodology can be embedded in the UK and that students and researchers working with the North-West STEM at Liverpool and the SuperSTEMs at Daresbury can benefit over the next few years.The systems on which we propose to gather new results and demonstrate the usefulness of the techniques include III-V and III-nitride semiconducting systems which are being grown at Liverpool and by Dr Sanchez' colleagues in Spain.
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Key Findings |
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Potential use in non-academic contexts |
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Impacts |
Description |
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Summary |
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Date Materialised |
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Sectors submitted by the Researcher |
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Project URL: |
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Further Information: |
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Organisation Website: |
http://www.liv.ac.uk |