| EPSRC Reference: |
GR/S96463/01 |
| Title: |
Novel Atom Scale Characterisation of Advanced Thin Film Structures |
| Principal Investigator: |
Cerezo, Professor A |
| Other Investigators: |
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| Researcher Co-Investigators: |
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| Project Partners: |
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| Department: |
Materials |
| Organisation: |
University of Oxford |
| Scheme: |
LINK |
| Starts: |
01 June 2005 |
Ends: |
30 November 2008 |
Value (£): |
193,252
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| EPSRC Research Topic Classifications: |
| Materials Characterisation |
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| EPSRC Industrial Sector Classifications: |
| Communications |
Electronics |
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| Panel History: |
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Summary on Grant Application Form |
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The aim of the project is to provide a scanning atom probe analytical tool complemented by a suitable specimen preparation process to allow the development and subsequent reproducible manufacture of new thin film structures for advanced applications such as magnetic recording heads. The data from the scanning atom probe will be correlated with and calibrated by use of high resolution x-ray metrology. Through the detailed study by scanning atom probe microscopy of the interface structures of thin magnetic layers used in magnetic storage devices, the models of interface structure used in the detailed interpretation of diffuse x-ray scatter will be refined and enhanced.
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Key Findings |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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Potential use in non-academic contexts |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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Impacts |
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| Description |
This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk |
| Summary |
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| Date Materialised |
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Sectors submitted by the Researcher |
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This information can now be found on Gateway to Research (GtR) http://gtr.rcuk.ac.uk
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| Project URL: |
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| Further Information: |
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| Organisation Website: |
http://www.ox.ac.uk |