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| Name: |
Professor JM Rodenburg |
| Organisation: |
University of Sheffield |
| Department: |
Electronic and Electrical Engineering |
| Current EPSRC-Supported Research
Topics: |
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| Current EPSRC Support |
| There is no current EPSRC Support |
| Previous EPSRC Support |
| EP/I022562/1 | Phase modulation technology for X-ray imaging | (C) |
| EP/E034055/1 | Ultimate Microsocopy: Wavelength-Limited Resolution Without High Quality Lenses | (P) |
| GR/S85689/01 | BASIC TECHNOLOGY: Nanorobotics - Technologies for Simultaneous Multidimensional Imaging & Manipulation of Nanoobjects | (C) |
| GR/R75076/02 | Advanced reference-beam transmission electron microscopy | (P) |
| GR/R75076/01 | Advanced reference-beam transmission electron microscopy | (P) |
| GR/R65626/01 | Focused Ion Beam Machining and Deposition Applications to Functional and Structural Materials Research | (R) |
| GR/N02993/01 | AN ANALYTICAL ELECTRON MICROSCOPY STUDY OF PVD COATINGS MECHANISMS ON TOOL CUTTING EDGES AND CORNERS | (P) |
| GR/L21686/01 | NANOSCALE ENERGY RESOLVED ELECTRON IMAGING AND ANALYSIS | (C) |
| GR/H93163/01 | MEASUREMENT AND IMPROVEMENT OF HIGH-ENERGY ELECTRON BEAM COHERENCE | (C) |
| GR/F74813/01 | SUB-ATOMIC TRANSMISSION ELECTRON MICROSCOPY | (C) |
| GR/F16752/01 | SECONDARY ELECTRON IMAGING AND SPECTROSCOPY WITH HIGH SPATIAL RESOLUTION | (C) |
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Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator
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