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Name: |
Professor CG Smith |
Organisation: |
University of Cambridge |
Department: |
Physics |
Current EPSRC-Supported Research
Topics: |
Condensed Matter Physics
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Electronic Devices & Subsys.
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Quantum Optics & Information
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Current EPSRC Support |
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Previous EPSRC Support |
EP/N015118/1 | Quantum technology capital: QUES2T (Quantum Engineering of Solid-state Technologies) | (C) |
EP/M009505/1 | Versatile Quantum Multiplexing | (C) |
EP/M022625/1 | VERSATILE QUANTUM MULTIPLEXING EQUIPMENT AND FACILITY BID | (C) |
EP/K004077/1 | Nanoelectronic Based Quantum Physics- Technology and Applications. | (C) |
EP/J003417/1 | Beyond modulation doping | (C) |
EP/J00412X/1 | Mapping Spin Polarisation in Quasi-One-Dimensional Channels | (C) |
EP/I014268/1 | Quantum Multiplexer | (C) |
EP/I029575/1 | Scanning probe microscopy of the quantum Hall effect and charge pumping in graphene for meterological applications | (P) |
EP/H017720/1 | Electron-hole bilayers: Excitonic phases and collective modes | (C) |
EP/D008506/1 | Physics and Technology of Semiconductor Quantum Nanostructures | (C) |
EP/C009487/1 | A cryogen-free single-millikelvin system for measurement on nanoelectronic devices and quantum spin systems | (C) |
GR/R67521/01 | Carbon Based Electronics - Quantized Adiabatic Charge Transport in Carbon Nanotubes | (P) |
GR/R54224/01 | Semiconductor Quantum Nanoelectronics: Physics and Applications | (C) |
GR/N64595/01 | SPINTRONICS NETWORK | (C) |
GR/M49922/01 | A LOW TEMPERATURE HIGH FREQUENCY SCANNING NON-INVASIVE VOLTAGE PROBE | (P) |
GR/L42032/01 | A LOW TEMPERATURE SCANNING NON-INVASIVE VOLTAGE PROBE | (P) |
GR/L73395/01 | THE PHYSICS AND TECHNOLOGY OF 3D NANOSTRUCTURES AND DEVICES | (C) |
GR/K93013/01 | ROPA QUANTIZED VIBRATIONS OF MICRO-MECHANICAL STRUCTURES COMBINED WITH SINGLE ELECTRON CHARGING | (P) |
GR/K89344/01 | SUB-MICRON MAGNETIC CONTACTS TO SUB-MICRON SEMICONDUCTOR DEVICES | (P) |
GR/K34443/01 | PHYSICS AND TECHNOLOGY OF THREE DIMENSIONAL NANOMETRE ELECTRONIC STRUCTURES | (C) |
GR/J40621/01 | A MODIFIED FORCE MICROSCOPE AS A LOW TEMPERATURENM SCALE PROBE OF SUB-MICRON SEMICONDUCTOR DEVICES. | (P) |
GR/G63223/01 | DATA ACQUISITION SYSTEM FOR MEASURING THE PROPERTIES OF A QUANTUM BOX | (P) |
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Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator
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