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| Name: |
Dr SP Tear |
| Organisation: |
University of York |
| Department: |
Physics |
| Current EPSRC-Supported Research
Topics: |
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Analytical Science
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Biomaterials
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Catalysis & Applied Catalysis
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Chemical Biology
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Condensed Matter Physics
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Image & Vision Computing
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Instrumentation Eng. & Dev.
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Manufacturing Machine & Plant
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Materials Characterisation
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Materials testing & eng.
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| Current EPSRC Support |
| EP/V012762/1 | SEE MORE MAKE MORE: Secondary Electron Energy Measurement Optimised for Reliable Manufacture of Key Materials: Opportunity, Realisation, Exploitation | (C) |
| EP/S033394/1 | Aberration-Corrected Scanning Transmission Electron Microscope with atomic resolution spectroscopy under controlled environmental conditions: AC-eSTEM | (C) |
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| Previous EPSRC Support |
| EP/E022634/1 | Structural Studies of Strained and Nanostructured Rare Earth Silicides and Germanides Using MEIS and STM. | (P) |
| EP/D03471X/1 | Surface magnetic and structural properties studied with metastable de-excitation spectroscopy. | (C) |
| EP/D034604/1 | Surface magnetic and structural properties studied with metastable de-excitation spectroscopy. | (P) |
| EP/C536045/1 | Development of an SEM detector for nanometric analysis | (P) |
| GR/R88823/01 | Medium energy ion scattering of surface and near surface structure and composition with atomic resolution | (P) |
| GR/R88809/01 | Medium energy ion scattering studies of surface and near surface structure and composition with atomic resolution | (C) |
| GR/R34257/01 | Metastable De-exication Spectroscopy for Surface Analysis using a Laser-Focussed He* Beam | (C) |
| GR/L96905/01 | SURFACE CRYSTALLOGRAPHY OF RARE-EARTH METALS ON SEMICONDUCTORS USING LEED, MEIS, AND STM | (P) |
| GR/K02022/01 | EFFECT OF ALLOYING & MORPHOLOGY ON THE EXCHANGE COUPLING IN TRANSITION METAL MAGNETIC MULTILAYERS | (C) |
| GR/H71802/01 | STM/SEM STUDIES OF INTERFACES OF MULTILAYER SEMICONDUCTER MATERIALS | (P) |
| GR/H32940/01 | QUANTITATIVE LEED ANALYSES OF FE/SI(111),FESI2/SI(111) AND SI/FESI2/SI(111) | (P) |
| GR/G40057/01 | THE SURFACE CRYSTALLOGRAPHY OF SEMICONDUCTORS GROWN ON METAL SEMICONDUCTOR SURFACES BY LEED AND STM | (P) |
| GR/E90120/01 | SURFACE STRUCTURE ANALYSIS OF SEMICONDUCTOR MATERIALS USING SCANNING TUNELLING MICROSCOPY | (P) |
| GR/E74908/01 | SCANNING TUNNELING MICROSCOPY AND LEED FOR SURFACE CRYSTALLOGRAPHY OF SEMICONDUCTOR MATERIALS | (P) |
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Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator
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