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Researcher Details
 
Name: Professor AJ Walton
Organisation: University of Edinburgh
Department: Sch of Engineering
Current EPSRC-Supported Research Topics:
Analytical Science Bioelectronic Devices
Chemical Structure Electronic Devices & Subsys.
Fluid Dynamics Multiphase Flow
Optoelect. Devices & Circuits

Current EPSRC Support
EP/S019588/1 Enhanced Multiscale Boiling Surfaces (EMBOSS): From Fundamentals to Design(C)
EP/L016753/1 EPSRC Centre for Doctoral Training in Intelligent Sensing and Measurement(C)
Previous EPSRC Support
EP/P005705/1 New Engineering Concepts from Phase Transitions: A Leidenfrost Engine(C)
EP/N011341/1 Flow Boiling and Condensation of Mixtures in Microscale(C)
EP/K034510/1 Implantable Microsystems for Personalised Anti-Cancer Therapy(C)
EP/K00963X/1 Boiling in microchannels: integrated design of closed-loop cooling system for devices operating at high heat fluxes(C)
EP/J000779/1 REFINE: A coordinated materials programme for the sustainable REduction of spent Fuel vital In a closed loop Nuclear Energy cycle(C)
EP/F060076/1 Hybrid organic semiconductor/gallium nitride/CMOS smart pixel arrays(C)
EP/E018939/1 Bridging the Gaps Between Engineering and Mathematics in the Edinburgh Research Partnership(C)
EP/C532813/1 BOILING HEAT TRANSFER WITH CONTROLLED ARRAYS OF NUCLEATION SITES ON SILICON SURFACES(C)
EP/D500109/1 Boiling and Condensation in Microchannels(C)
EP/C546318/1 ESPACENET: Evolvable Networks of Intell't & Secure Integrated & Dist'd Reconfigurable System-On-Chip Sensor Nodes for A'space Based Monitoring & Diag'(C)
EP/C541820/1 Equipment for Supporting Microsystems Research at Edinburgh & IMRC related projects at Cambridge, Cranfield, Heriot-Watt & Loughborough(P)
EP/C51503X/1 ReSIP - Reconfigurable System-on-Chip based Networks of Integrated and Distributed Sensor Platform Nodes for Environmental Diagnostic and Sensing(C)
GR/T11531/01 Optimisation of sub-100nm copper-interconnect & photoresist tracks for high-density IC fabrication metrology(P)
GR/T06322/01 Integration of Microelectromechanical Systems (MEMS) with Electronics in Silicon Carbide for Harsh Environments(C)
GR/T07879/01 NETWORK:Silicon Research and Exploitation For the Nanotechnology Era(C)
GR/S12838/01 PLATFORM: PLATFORM GRANT TO SUPPORT THE DEVELOPMENT OF MICRO/NANO TECHNOLOGY ACROSS A RANGE OF DISCIPLINES(P)
GR/R65589/01 Talking with Nerve Cells: Developing Communication Between Living Vertebrate Neurons and Electronic Systems(C)
GR/R38019/01 Development of Low Damage Dry Etch Processes for Silicon Carbide Microelectromechanical Systems (MEMS)(C)
GR/M62280/01 JIF:EQUIP.TO SUPPORT R&D INVOLV.THE MICROFABRICATION OF ADV.DEVICES & SYSTEMS BASED ON POST-PRO.FOUNDRY SIL(P)
GR/M39305/01 IMPROVING THE LINK BETWEEN DESIGN AND TEST FOR MINIATURE SILICON BACKPLANE LIQUID CRYSTAL DISPLAYS(C)
GR/M41070/01 ACME -- AL TO CU METALLISATION FOR IMPROVED RELIABILITY OF DEEP SUB - MICRON LINES AND VIAS(P)
GR/M13534/01 MANUFACTURING AND PACKAGING OF MINIATURE LIQUID CRYSTAL DISPLAY SYSTEM(C)
GR/L63648/01 CRITICAL AREA EXTRACTION FOR LEADING IC TECHNOLOGY(P)
GR/L81000/01 DEVELOPMENT OF TEST STRUCTURES FOR CHARACTERISING IC TECHNOLOGIES(P)
GR/K89733/01 INCORPORATION OF FACTORY SIMULATION INTO THE TOTAL TCAD FRAMEWORK(P)
GR/L14664/01 YIELD PREDICTION AND DFM OF IC LAYOUT(P)
GR/J78471/01 AN IMPROVED OPTIMISATION STRATEGY FOR SEMICONDUCTOR PROCESSES(P)
GR/J78457/01 FORMATION OF ALUMINIUM PLUGS USING A TEMPERATURE DEPENDENT STRESS RELIEVING MECHANISM(C)
GR/J45824/01 AUTOMATED THREE DIMENSIONAL INTERCONNECT SIMULATION FOR SUB-MICRON CIRCUIT DESIGN(P)
GR/J59173/01 DFM STRATEGIES FOR THE MANUFACTURE OF INTEGRATED CIRCUITS(P)
GR/H40075/01 PRACTICAL YIELD OPTIMISATION FOR LARGE AREA ICS USING YIELD PREDICTION AND LAYOUT ADJUSTMENT(P)
GR/H32759/01 TWO DIMENSIONAL ANALYSIS OF DOPANT AND IMPURITY DISTRIBUTIONS IN SEMICONDUCTORS USING SIMS(C)
GR/H49856/01 TWO DIMENSIONAL ANALYSIS OF DOPANT AND IMPURITY DISTRIBUTIONS IN SEMICONDUCTORS USING SIMS(P)
GR/G28062/01 DEVELOPMENT AND SUPPORT FOR THE EDINBURGHMICROFABRICA TION FACILITY(C)
GR/F38884/01 DEVELOPMENT OF INTEGRATED PROCESS AND DEVICE MODELLINGWITH APPLICATIONS TO SUB MICRON DEVICES(P)
Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator