| EP/P001440/1 | IBA-DAPNe: a new system for sub-micron scale molecular speciation and quantification | (C) |
| EP/N035216/1 | Vacancy-Rich Silicon as a Flexible Thermoelectric Material | (P) |
| EP/N015215/1 | Quantum technology capital: Multi-species single-ion implantation | (C) |
| EP/M01861X/1 | Radiation Damage in Nanoporous Nuclear Materials | (P) |
| EP/I036516/1 | Ambient Pressure Mass Spectrometry at the Sub Micron Scale | (P) |
| EP/H026622/1 | Coherent Optical and Microwave Physics for Atomic-Scale Spintronics in Silicon (COMPASSS) | (C) |
| EP/E035728/1 | Laser Induced Beams of Radiation and their Applications (LIBRA | (C) |
| EP/F012985/1 | Enhancing new developments in ToF-SIMS through researcher exchanges | (C) |
| EP/E032869/1 | The Non Scaling FIxed Field Alternating Gradient (NS-FFAG) Accelerator | (C) |
| EP/C009592/1 | MeV ion nanobeams: nanotechnology for the 21st century | (C) |
| EP/D032210/1 | University of Surrey Ion Beam Centre | (P) |
| EP/C009339/1 | New Developments in ToF-SIMS Surface Mass Spectrometry with ATR-IR Spectroscopy | (P) |
| EP/C008251/1 | New Developments in ToF-SIMS Surface Mass Spectrometry with ATR-IR Spectroscopy | (C) |
| GR/S91512/01 | NETWORK: Research Network Bio-Medical Applications of High Energy Ion Beams. | (C) |
| GR/S48363/01 | Community Meeting on the Future of Ion Surface Interactions Research in the UK | (P) |
| GR/R50097/01 | The University of Surrey Ion Beam Centre | (P) |
| GR/N39364/01 | VALIDATION OF SHALLOW JUNCTIONS BY STM | (C) |
| GR/M94434/01 | AN ENHANCED UK FACILITY FOR ION BEAM ANALYSIS OF KEY STRATEGIC MATERIALS | (C) |
| GR/M85210/01 | IRRADIATION DAMAGE TECHNOLOGY FOR MANUFACTURABLE SUPERCONDUCTING DEVICES | (P) |
| GR/L78512/01 | THE UNIVERSITY OF SURREY ION BEAM CENTRE | (C) |
| GR/L66199/01 | IRRADIATION DAMAGE TECHNOLOGY FOR MANUFACTURABLE SUPERCONDUCTING DEVICES | (C) |
| GR/K56247/01 | THE UNIVERSITY OF SURREY ION BEAM FACILITY FOR MICROELECTRONICS | (C) |
| GR/J42298/01 | THE UNIVERSITY OF SURREY ION BEAM FACILITY FOR MICROELECTRONICS | (C) |
| GR/H14366/01 | NON-DESTRUCTIVE CHARACTERIZATION OF SEMICONDUCTORS USING MICROSCOPE-SPECTROPHOTOMETRY | (C) |
| GR/F84683/01 | A MOLECULAR DYNAMICS STUDY OF CARBON SELF-SPUTTERING USING MANY-BODY POTENTIALS | (C) |
| GR/F57786/01 | SCANNING TUNNELLING MICROSCOPY OF SEMICONDUCTORS | (P) |
| GR/F36200/01 | FUNDAMENTAL STUDIES TO DEVELOP NEW PROCESS AND DEVICE MODELS | (P) |