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Name: |
Professor G Briggs |
Organisation: |
University of Oxford |
Department: |
Materials |
Current EPSRC-Supported Research
Topics: |
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Current EPSRC Support |
There is no current EPSRC Support |
Previous EPSRC Support |
GR/N23967/01 | ROPA: NANOTUBE QUANTUM LOGIC GATE: PUMP-PRIMING PROOF- OF-PRINCIPLE | (P) |
GR/M61023/01 | (JIF) INDUSTRIAL MATERIALS AND MANUFACTURING | (C) |
GR/M54032/01 | GROWTH AND CHARACTERISATION OF QUANTUM SILICIDE AND NITRIDE ISLANDS | (P) |
GR/L02234/01 | ULTRASONIC FORCE MICROSCOPE - IMAGING AND MEASURING NANOSCALE MECHANICAL PROPERTIES | (P) |
GR/L27633/01 | QUANTITATIVE NDT OF SURFACE DAMAGE IN GLASS AND CERAMICS | (C) |
GR/K82451/01 | QUANTITATIVE NDT OF SURFACE DAMAGE IN GLASS CERAMICS. | (C) |
GR/K08161/01 | LOCAL ADSORPTION AND DYNAMICS AT SURFACES: VARIABLE TEMPERATURE STM | (P) |
GR/K48532/01 | ADHESIVE/ADHEREND INTERLAYER PROPERTY MEASUREMENT BY ACOUSTIC MICROSCOPY | (P) |
GR/J37416/01 | TIME-RESOLVED ACOUSTIC MICROSCOPY OF SHORT FATIGUE CRACKS | (P) |
GR/J08485/01 | CHARACTERISATION OF SURFACE ROUGHNESS AND SUB-SURFACE DAMAGE | (P) |
GR/J02339/01 | APPLICATION OF MAGNETOACOUSTIC EMISSION TO THE MONITORING OF STRESS | (C) |
GR/H59305/01 | ADHESIVE/ADHEREND INTERLAYER PROPERTY MEASUREMENT BY ACOUSTIC MICROSCOPY-FEASIBILITY STUDY | (P) |
GR/H34012/01 | TUNNELING MICROSCOPY OF ORGANIC ADSORBATES ON SEMICONDUCTORS | (P) |
GR/E67825/01 | MEASUREMENT OF INTERNAL STRESS BY MAGNETOACOUSTIC EMISSION | (P) |
GR/E76391/01 | ACOUSTIC MICROSCOPY OF SHORT FATIGUE CRACKS SERC/CEGB CO FUNDING | (P) |
GR/E93398/01 | THE APPLICATIONS OF SCANNING TUNNELLING MICROSCOPY IN THE STUDY OF ORDERED ADSORBATE LAYERS | (P) |
GR/E60185/01 | SCANNING TUNNELING MICROSCOPY OF SEMICONDUCTOR MATERIALS | (P) |
GR/E10883/01 | HIGH RESOLUTION SCANNING ACOUSTIC MICROSCOPY STUDIES OF DENTAL CARIES | (P) |
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Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator
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