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Name: |
Professor CR Whitehouse |
Organisation: |
Private Address |
Department: |
Private Address |
Current EPSRC-Supported Research
Topics: |
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Current EPSRC Support |
There is no current EPSRC Support |
Previous EPSRC Support |
GR/S02150/01 | FEGTEM Nanostructural Studies of Functional and Structural Materials | (C) |
GR/R65534/01 | Support for the EPSRC Central Facility for III-V Materials at Sheffield | (C) |
GR/R65626/01 | Focused Ion Beam Machining and Deposition Applications to Functional and Structural Materials Research | (R) |
GR/M47720/01 | NOVEL MEASURING INSTRUMENT FOR HOSTILE HIGH TEMPERATURE ENVIRONMENT | (C) |
GR/M11509/01 | SUPPORT FOR THE EPSRC CENTRAL FACILITY FOR 111-V MATERIALS AT SHEFFIELD | (P) |
GR/L28821/01 | OPTO-ELECTRONIC INVESTIGATIONS OF SEMICONDUCTOR QUANTUM DOTS AND QUANTUM WIRES. | (C) |
GR/L22195/01 | ADVANCED NANOSTRUCTURAL STUDIES OF FUNCTIONAL AND STRUCTURAL MATERIALS | (C) |
GR/K96977/01 | INTERDISCIPLINARY RESEARCH CENTRE FOR SEMICONDUCTOR MATERIALS 1996-1999 | (C) |
GR/K55905/01 | PIEZOMAGNETIC MATERIALS FOR NEXT GENERATION MICROELECTROMECHANICAL SYSTEMS | (P) |
GR/K64105/01 | SUPPORT FOR THE SHEFFIELD CENTRAL FACILITY FOR III - V SEMICONDUCTORS | (P) |
GR/K27698/01 | IN (GAA1)AS & IN(GAA1)P STRAINED LAYER HETEROSTRUCTURE FOR ENHANCED OPTOELECTRONIC DEVICE APPLICATIONS | (C) |
GR/J93894/01 | MOVPE GROWTH, CHARACTERIZATION, PHYSICS AND DEVICES OF GAN AND RELATED MATERIALS | (P) |
GR/J97540/01 | IRC FOR THE STUDY OF THE GROWTH, CHARACTERISATION AND APPLICATION OF SEMICONDUCTOR MATERIALS | (C) |
GR/J21699/01 | SUPPORT FOR THE SHEFFIELD CENTRAL FACILITY FOR III-V SEMICONDUCTORS | (P) |
GR/J55359/01 | IN-SITU SYNCHROTRON X-RAY TOPOGRAPHY/DIFFRACTION STUDIES OF STRAINED- LAYER SEMICONDUCTOR GROWTH PROCESSES | (P) |
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Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator
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