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Name: |
Professor JF Zhang |
Organisation: |
Liverpool John Moores University |
Department: |
School of Engineering |
Current EPSRC-Supported Research
Topics: |
Electronic Devices & Subsys.
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Software Engineering
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Current EPSRC Support |
EP/T026022/1 | Realistic fault modelling to enable optimization of low power IoT and Cognitive fault-tolerant computing systems | (P) |
EP/S000259/1 | Variability-aware RRAM PDK for design based research on FPGA/neuro computing | (C) |
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Previous EPSRC Support |
EP/M006727/1 | Mechanisms and Control of Resistive Switching in Dielectrics | (C) |
EP/L010607/1 | Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization | (P) |
EP/I012966/1 | High permittivity dielectrics on Ge for end of Roadmap application | (P) |
EP/C003071/1 | Performance, degradation and defect structure of MOS devices using high-k materials as gate dielectrics | (P) |
GR/R10387/01 | Hole Trap Generation and It's Role In Oxide Breakdown | (P) |
GR/L28531/01 | THE POST-STRESS DEGRADATION OF MOS DEVICES | (P) |
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Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator
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