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Name: |
Professor P Hemment |
Organisation: |
University of Surrey |
Department: |
ATI Electronics |
Current EPSRC-Supported Research
Topics: |
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Current EPSRC Support |
There is no current EPSRC Support |
Previous EPSRC Support |
GR/R03778/01 | Sigec Hbts On Insulator For Rf Communications | (P) |
GR/M20068/01 | NEW SILICON ON INSULATOR (SOI) HIGH VOLTAGE DEVICES | (C) |
GR/L78512/01 | THE UNIVERSITY OF SURREY ION BEAM CENTRE | (C) |
GR/L42957/01 | NEW SILICON ON INSULATOR (SOI) HIGH VOLTAGE DEVICES | (C) |
GR/L50013/01 | ION BEAM SYNTHESIS OF SIGE HBTS AND HMOSTS FOR HIGH SPEED, LOW POWER COMMUNICATIONS APPLICATIONS | (P) |
GR/K56247/01 | THE UNIVERSITY OF SURREY ION BEAM FACILITY FOR MICROELECTRONICS | (C) |
GR/J42298/01 | THE UNIVERSITY OF SURREY ION BEAM FACILITY FOR MICROELECTRONICS | (C) |
GR/J14585/01 | CONTROL OF DEFECT AND DOPANT DISTRIBUTIONS IN ION IMPLANTED SIGE HBT STRUCTURES | (P) |
GR/H72229/01 | ADVANCED SOI SUBSTRATES (SIMOX) | (P) |
GR/H16452/01 | THE UNIVERSITY OF SURREY ION BEAM FACILITY FOR MICROELECTRONICS | (C) |
GR/F66078/01 | STUDY OF PROCESS INDUCED DEFECTS IN MEV IMPLANTED AND PRE-AMORPHIZED SILICON | (P) |
GR/F63916/01 | THE UNIVERSITY OF SURREY ION BEAM FACILITY FOR MICROELECTRONICS | (C) |
GR/F34572/01 | HIGH PRECISION CHEMICAL ANALYSIS FOR FUTURE SILICON MATERIALS AND DEVICES | (P) |
GR/F35142/01 | MATERIALS PROCESING FOR ADVANCED SOI SUBSTRATES | (P) |
GR/E76339/01 | NOVEL DIELECTRIC STRUCTURES FOR SMALL GEOMETRY DEVICES | (P) |
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Key: (P)=Principal Investigator, (C)=Co-Investigator, (R)=Researcher Co-Investigator
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