EP/N014995/1 | Quantum Technology Capital: An extensible simulation and test platform for quantum and quantum enabled technologies | (P) |
EP/J015067/1 | Molecular quantum devices | (P) |
EP/H001972/1 | Putting spin into carbon nanoelectronics | (P) |
EP/F028806/1 | NSF: Templated Ordered Endohedral Fullerenes as Building Blocks for Quantum Computing | (P) |
EP/F048009/1 | Platform Grant Support for Materials Characterisation at Oxford | (C) |
EP/F024525/1 | Diamond microstructures for quantum information technologies | (C) |
EP/D074398/1 | Resubmission of IMPRESS: Intra-Molecular Propagation of Electron Spin States | (P) |
EP/D048761/1 | Supramolecular self-assembly of 1-10nm templates for biofunctional surfaces, quantum information processing and nanoelectronics | (C) |
GR/S82176/01 | Interdisciplinary Research Collaboration in Quantum Information Processing | (P) |
GR/S23421/01 | Basic Technologies: Cryogenic instrumentation for quantum electronics | (P) |
GR/S15808/01 | Quantum Information Processing IRC, Director | (P) |
GR/R80919/01 | Use of Electric Fields for Controlled Patterning of Thin Polymer Films | (C) |
GR/R66029/01 | Nanoelectronics at the quantum edge | (P) |
GR/N31887/01 | ANTI-CORROSIVE PAINTS: STUDIES BY SCANNING ACOUSTIC MICROSCOPY AND SCANNING KELVIN PROBE | (C) |
GR/N23967/01 | ROPA: NANOTUBE QUANTUM LOGIC GATE: PUMP-PRIMING PROOF- OF-PRINCIPLE | (P) |
GR/M61023/01 | (JIF) INDUSTRIAL MATERIALS AND MANUFACTURING | (C) |
GR/M54032/01 | GROWTH AND CHARACTERISATION OF QUANTUM SILICIDE AND NITRIDE ISLANDS | (P) |
GR/L02234/01 | ULTRASONIC FORCE MICROSCOPE - IMAGING AND MEASURING NANOSCALE MECHANICAL PROPERTIES | (P) |
GR/L27633/01 | QUANTITATIVE NDT OF SURFACE DAMAGE IN GLASS AND CERAMICS | (C) |
GR/K82451/01 | QUANTITATIVE NDT OF SURFACE DAMAGE IN GLASS CERAMICS. | (C) |
GR/K08161/01 | LOCAL ADSORPTION AND DYNAMICS AT SURFACES: VARIABLE TEMPERATURE STM | (P) |
GR/K48532/01 | ADHESIVE/ADHEREND INTERLAYER PROPERTY MEASUREMENT BY ACOUSTIC MICROSCOPY | (P) |
GR/J37416/01 | TIME-RESOLVED ACOUSTIC MICROSCOPY OF SHORT FATIGUE CRACKS | (P) |
GR/J08485/01 | CHARACTERISATION OF SURFACE ROUGHNESS AND SUB-SURFACE DAMAGE | (P) |
GR/J02339/01 | APPLICATION OF MAGNETOACOUSTIC EMISSION TO THE MONITORING OF STRESS | (C) |
GR/H59305/01 | ADHESIVE/ADHEREND INTERLAYER PROPERTY MEASUREMENT BY ACOUSTIC MICROSCOPY-FEASIBILITY STUDY | (P) |
GR/H34012/01 | TUNNELING MICROSCOPY OF ORGANIC ADSORBATES ON SEMICONDUCTORS | (P) |
GR/E67825/01 | MEASUREMENT OF INTERNAL STRESS BY MAGNETOACOUSTIC EMISSION | (P) |
GR/E76391/01 | ACOUSTIC MICROSCOPY OF SHORT FATIGUE CRACKS SERC/CEGB CO FUNDING | (P) |
GR/E93398/01 | THE APPLICATIONS OF SCANNING TUNNELLING MICROSCOPY IN THE STUDY OF ORDERED ADSORBATE LAYERS | (P) |
GR/E60185/01 | SCANNING TUNNELING MICROSCOPY OF SEMICONDUCTOR MATERIALS | (P) |
GR/E10883/01 | HIGH RESOLUTION SCANNING ACOUSTIC MICROSCOPY STUDIES OF DENTAL CARIES | (P) |