EPSRC Reference: |
GR/H95495/01 |
Title: |
CRYOGENIC CATHODOLUMINESCENCE IMAGING AND SPECTROSCOPY OF DEFECTS IN THIN FILM DIAMOND, SI AND SIGE |
Principal Investigator: |
Collins, Professor AT |
Other Investigators: |
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Researcher Co-Investigators: |
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Project Partners: |
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Department: |
Physics |
Organisation: |
Kings College London |
Scheme: |
Standard Research (Pre-FEC) |
Starts: |
01 May 1993 |
Ends: |
30 April 1995 |
Value (£): |
267,002
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EPSRC Research Topic Classifications: |
Materials Characterisation |
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EPSRC Industrial Sector Classifications: |
Aerospace, Defence and Marine |
Electronics |
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Related Grants: |
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Panel History: |
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Summary on Grant Application Form |
A scanning electron microscope (Jeol JSM 35C) will be substantially modified to establish a facility for cryogenic (4.2K to 77K) cathodoluminescence monochromatic imaging and Fourier transform cathodoluminescence spectroscopy. The spectral range will be 200nm to 2.8um, and Fourier transform spectroscopy will be employed to combine high resolution and high sensitivity in the cathodoluminescence measurements. Custom narrow band interference filters will be used for efficient cathodoluminescence imaging. This facility will be employed to relate specific luminescence features to specific impurities and defects, and to identify and spatially locate impurities and defects in thin film diamond and silicon and silicon-germanium heterostructures. One aspect of this work is to study the basic physics and chemistry of impurity incorporation and the formation of point defects and the decoration of extended defects, and to relate their electronic and atomic structures. The other major aspect is to use this information to characterise materials, to optimise growth procedures and ultimately to determine their suitability for device applications.
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Key Findings |
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Potential use in non-academic contexts |
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Impacts |
Description |
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Summary |
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Date Materialised |
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Sectors submitted by the Researcher |
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Project URL: |
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Further Information: |
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Organisation Website: |
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