| EPSRC Reference: |
GR/J01868/01 |
| Title: |
HIGH RESOLUTION X-RAY SCATTERING AND TOPOGRAPHYOF THIN FILMS. |
| Principal Investigator: |
Tanner, Prof. B |
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| Department: |
Physics |
| Organisation: |
Durham, University of |
| Scheme: |
Standard Research (Pre-FEC) |
| Starts: |
01 July 1993 |
Ends: |
30 June 1994 |
Value (£): |
46,707
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| EPSRC Research Topic Classifications: |
| Materials Characterisation |
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Summary on Grant Application Form |
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We propose a programme of structural studies of thin layer compounds using both laboratory and synchrotron based high resolution X-ray scattering and topography. Novel X-ray scattering experiments will be undertaken to characterise II-VI, III-V semiconductors and magnetic multilayers. Diffuse grazing incidence X-ray reflectance will be exploited to determine interface structure of metallic multilayers, synchrotron radiation being used to make anomalous dispersion measurements on 2d-2d systems. Triple axis diffractometry and double axis topography will be used to measure tilt and dilation distributions in II-VI epilayers, principally of Mn(x)Hg(1-x)Te. Measurements of the diffuse scatter will be undertaken to identify the character of point defects in this material. Double axis topography will be used to map long range strain and composition distributions and variable wavelength diffractometry used to probe perfection as a function of depth. The data will be tested against model of relaxation in highly mismatched systems. Anomalous dispersion measurements of quasi-forbidden reflections will be pursued to measure stoichiometry of CdTe. Interferometric X-ray topography will be developed to measure large scale variations in this III-V layer structures.
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Key Findings |
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Potential use in non-academic contexts |
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Impacts |
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| Description |
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Sectors submitted by the Researcher |
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