EPSRC Reference: |
GR/J55359/01 |
Title: |
IN-SITU SYNCHROTRON X-RAY TOPOGRAPHY/DIFFRACTION STUDIES OF STRAINED- LAYER SEMICONDUCTOR GROWTH PROCESSES |
Principal Investigator: |
Whitehouse, Professor CR |
Other Investigators: |
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Researcher Co-Investigators: |
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Project Partners: |
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Department: |
Electronic and Electrical Engineering |
Organisation: |
University of Sheffield |
Scheme: |
Standard Research (Pre-FEC) |
Starts: |
17 December 1993 |
Ends: |
16 June 1997 |
Value (£): |
339,322
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EPSRC Research Topic Classifications: |
Materials Synthesis & Growth |
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EPSRC Industrial Sector Classifications: |
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Related Grants: |
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Panel History: |
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Summary on Grant Application Form |
The initial 3-year phase of the DRA Malvern/SERC collaborative project (GR/F 84935, expiring Sept 93) has led to the successful construction of a world-first combined x-ray topography (XRT)/MBE facility. This chamber has very recently generated the first reported structural data recorded in-situ at different stages during the growth of InGaAs/GaAs strained-layer device structures, and has provided very important new data regarding the very intitial stages of strain-relaxation. Now that the new facility is fully proven, the present proposal seeks the funding required to continue the collaborative DRA/SERC project for a further 3-year period. Detailed in-situ experiments are planned to investigate strain-relaxation processes as a function of growth conditions, substrate orientation and compressive strain level in the InGaAs/GaAs system. Subsequent experiments, using the InGaAs/InP and InAlSb/InSb systems, will then investigate the influence of controlled tensile-strain levels. The unique experimental data obtained and the associated experiments will continue to be supported by state-of-the- art XRT image simulations, and the results will be used to establish important new predictive models for strain relaxation.
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Key Findings |
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Potential use in non-academic contexts |
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Impacts |
Description |
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Summary |
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Date Materialised |
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Sectors submitted by the Researcher |
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Project URL: |
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Further Information: |
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Organisation Website: |
http://www.shef.ac.uk |