| EPSRC Reference: |
GR/J77986/01 |
| Title: |
HIGH RESOLUTIONX-RAY SCATTERING STUDY OF INTERFACE STRUCTURE AND RELAXATION IN 2-6 SEMICONDUCTORS |
| Principal Investigator: |
Tanner, Prof. B |
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| Department: |
Physics |
| Organisation: |
Durham, University of |
| Scheme: |
Standard Research (Pre-FEC) |
| Starts: |
21 November 1994 |
Ends: |
20 November 1996 |
Value (£): |
75,878
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| EPSRC Research Topic Classifications: |
| Materials Characterisation |
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Summary on Grant Application Form |
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We propose a programme of structural studies on epitaxial systems of II-VI compounds using high resolution x-ray scattering and topography. The principal aim will be to investigate the structure of interfaces in MBE grown multilayers and relate this to electronic and optical behaviour in quantum well systems. A secondary aim will be to study the relaxation process in thick highly strained single layers and provide stringent tests of theoretical models of the process.
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Key Findings |
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Potential use in non-academic contexts |
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Impacts |
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| Description |
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Sectors submitted by the Researcher |
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