EPSRC Reference: |
GR/K72018/01 |
Title: |
HIGH RESOLUTION X-RAY SCATTERING FOR THIN FILM CHARACTERIZATION |
Principal Investigator: |
Tanner, Prof. B |
Other Investigators: |
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Researcher Co-Investigators: |
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Project Partners: |
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Department: |
Physics |
Organisation: |
Durham, University of |
Scheme: |
Standard Research (Pre-FEC) |
Starts: |
01 May 1996 |
Ends: |
30 April 1999 |
Value (£): |
178,737
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EPSRC Research Topic Classifications: |
Materials Characterisation |
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EPSRC Industrial Sector Classifications: |
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Panel History: |
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Summary on Grant Application Form |
We propose to develop and exploit a novel goniometer to perform X-ray scattering measurements on magnetic multilayers. Multilayer X-ray mirrors, recently available commercially, will be used to provide high intensity incident beams and medium resolution analysers with X-ray optics designed to optimise grazing incidence diffuse scattering and high angle medium resolution reciprocal space mapping. Together with anomalous dispersions synchrotron radiation measurements, we will use these novel configurations to measure the roughness, correlation lengths and fractal parameter of transition metal-transition metal multilayers to extend our present studies on the rle of interface structure in the giant magnetoresistance and other magnetic and magnetotransport properties. Similarly, we will investigate the rle of interface roughness on the anisotropy of transition metal-noble metal systems for magnetic recording applications. In parallel, medium resolution studies of the scattering at high angles will be undertaken on both types of system to relate structural, textural and metallurgical properties of the multilayers to the magnetic phenomena.
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Key Findings |
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Potential use in non-academic contexts |
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Description |
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Summary |
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Date Materialised |
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Sectors submitted by the Researcher |
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Project URL: |
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Further Information: |
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Organisation Website: |
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