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Details of Grant 

EPSRC Reference: GR/M20808/01
Title: LOW TEMPERATURE DEPOSITION OF POLYCRYSTALLINE SILICON FOR THIN FILM TRANSISTORS
Principal Investigator: Milne, Professor WI
Other Investigators:
Robertson, Professor J
Researcher Co-Investigators:
Project Partners:
Philips (UK)
Department: Engineering
Organisation: University of Cambridge
Scheme: Standard Research (Pre-FEC)
Starts: 01 October 1998 Ends: 30 September 2000 Value (£): 87,702
EPSRC Research Topic Classifications:
Electronic Devices & Subsys.
EPSRC Industrial Sector Classifications:
No relevance to Underpinning Sectors
Related Grants:
Panel History:  
Summary on Grant Application Form
The aim of this project is to produce micro- and poly-crystalline silicon thin films for Thin Film Transistors (TFTs) using an electron cyclotron wave resonance (ECWR) source. The deposition will be controlled using separate nucleation and growth phases. The nucleation will use alternative plasmas of SiH4 and H2 and growth will use a SiF4/H2/He plasma. The material will be characterised using XRD, TEM, Raman and electrical measurements. Optimised films will be used to fabricate thin film transistors.
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Further Information:  
Organisation Website: http://www.cam.ac.uk