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Details of Grant 

EPSRC Reference: GR/M57965/01
Title: SCANNING PROBE NANO-LITHOGRAPHY AND CHARACTERISATION OF CONJUGATED SEMICONDUCTORS
Principal Investigator: Cacialli, Professor F
Other Investigators:
Researcher Co-Investigators:
Project Partners:
Cambridge Display Technology Ltd (CDT)
Department: Physics
Organisation: University of Cambridge
Scheme: Standard Research (Pre-FEC)
Starts: 01 June 1999 Ends: 31 May 2002 Value (£): 143,937
EPSRC Research Topic Classifications:
Materials Characterisation Materials Synthesis & Growth
EPSRC Industrial Sector Classifications:
No relevance to Underpinning Sectors
Related Grants:
Panel History:  
Summary on Grant Application Form
This project aims to develop a SNOM system to be used as:1) a manufacturing tool for the fabrication of organic nano-structures, and 2) an analytical instrument.1) The alteration of the solubility of the PPV precursor upon exposure to UV radiation (or heat), makes it suitable for photolithographic (or thermolithographic) patterning. This will be carried out on a sub-wavelength scale by use of the near- field produced by the SNOM-tip, in order to fabricate structures with feature-size in the 100s nm range. The optical properties of these will be characterized by emission spectroscopies, while the electrical properties will be studied with both current-voltage, and photoconductivity spectroscopies.2) The combination of SNOM and AFM functionalities in the same set -up will allow a cost- efficient study of the local morphological and optical properties of conjugated polymers and of their dependence on morphology and molecular packing, with sub-micrometer resolution. This will allow insight to be gained in the PL quenching mechanism of conjugated polymers on ITO substrates.
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Organisation Website: http://www.cam.ac.uk