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Details of Grant 

EPSRC Reference: GR/M89485/01
Title: ULTRASTABLE SUPERRESOLVING HOLOGRAPHIC PROFILER
Principal Investigator: See, Dr C
Other Investigators:
Somekh, Professor M Walker, Dr JG
Researcher Co-Investigators:
Project Partners:
Guidance Control Systems Ltd Photronics (U K) Ltd
Department: Sch of Electrical and Electronic Eng
Organisation: University of Nottingham
Scheme: Standard Research (Pre-FEC)
Starts: 01 March 2000 Ends: 28 February 2003 Value (£): 200,030
EPSRC Research Topic Classifications:
Materials Characterisation
EPSRC Industrial Sector Classifications:
Manufacturing Electronics
No relevance to Underpinning Sectors
Related Grants:
Panel History:  
Summary on Grant Application Form
This project will demonstrate a novel optical profiler capable of unparalleled stability for an absolute phase interferometer. The system is almost totally common path ensuring stability of both amplitude and phase measurements. The key element is a computer generated hologram which splits the beam to form probe and reference beams. We will also demonstrate that the system can be made to operate in beam scanning mode by scanning the optical hologram. This will greatly improve the versatility of the system. The system will be demonstrated for measurement of surface roughness and critical dimension measurement. The exceptional stability and thus signal to noise of our system combined with the capability of simultaneously and accurately measuring phase and amplitude makes it particularly suited for the application of spectral extension methods. This will be the first time these methods have been applied to a microscope system with the necessary specification to extend the lateral resolution beyond that obtainable with far field methods. Various methods of spectral extension will be applied and tested on different sample. Tracks on samples with linewidths approaching 100nm will be measured using 430nm radiation.
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Organisation Website: http://www.nottingham.ac.uk