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Details of Grant 

EPSRC Reference: GR/N32945/01
Title: ULSI INTERCONNECTS: PROCESS MODELLING AND TEST FOR REL IABILITY AGAINST ELECTROMIGRATION AND STRESS-PROMOTES
Principal Investigator: O'Neill, Professor A
Other Investigators:
Bull, Professor S
Researcher Co-Investigators:
Project Partners:
Avant Zarlink
Department: Electrical, Electronic & Computer Eng
Organisation: Newcastle University
Scheme: Standard Research (Pre-FEC)
Starts: 01 October 2000 Ends: 30 November 2003 Value (£): 208,247
EPSRC Research Topic Classifications:
Materials testing & eng.
EPSRC Industrial Sector Classifications:
Electronics Information Technologies
Related Grants:
Panel History:  
Summary on Grant Application Form
The major cause of failure in IC manufacture is the back end metallisation. However, a feature of this which has received relatively little attention until recently is the impact of mechanical stress on reliability. No process modelling tools are available to directly estimate the effects of both stressmigration and electromigration on reliability. Stress measurements on single sub-micron interconnect tracks are also not currently possible. This programme will address these issues. A novel stress sensor will be optimised and fabricated and a process modelling capability will be established, building on existing in-house software for electromigration and the ANSYS finite element package for stressmigration. The simulator will take the specific details of the process and interconnect/via geometry, validated input data and details of other processing stages (eg annealing) and calculate the stresses in a multilevel interconnect line. The output of the model will then be passed to a modified electromigration simulator to test how stress affects reliability. The tool will be calibrated against experimental data obtained from the novel stress sensor as well as from more conventional techniques and then used to investigate design rules/ safe operation zones for several different back end processing applications.
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Organisation Website: http://www.ncl.ac.uk